๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Design of dynamic test equipment for the testing of dental implants

โœ Scribed by M. Barry; D. Kennedy; K. Keating; Z. Schauperl

Book ID
108200590
Publisher
Elsevier Science
Year
2005
Weight
563 KB
Volume
26
Category
Article
ISSN
0261-3069

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Any time a structure experiences stress reversal, part of its life is used up. The two most common types of stress cycles that cause the most damage in electronic equipment are thermal/temperature cycling and vibration cycling. These two types of cycling can occur separately or they can be combined.