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Design of a test structure to evaluate electro-thermomigration in power ICs

✍ Scribed by I. De Munari; F. Speroni; M. Reverberi; C. Neva; L. Lonzi; F. Fantini


Book ID
103286630
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
256 KB
Volume
36
Category
Article
ISSN
0026-2714

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