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Design of a tapered impedance-matching line using inverse scattering

✍ Scribed by Choongho Song; Sangseol Lee

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
119 KB
Volume
32
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

A new design method for a tapered impedance‐matching line is proposed. The accurate characteristic impedance profile of the desired matching line is obtained through the accurate profile inversion of a virtual dielectric medium which is equivalent to the matching line in view of the reflection characteristic. Then, the matching line is synthesized according to the characteristic impedance profile. The method can be applied to design impedance‐matching lines with arbitrary passband characteristics without any equivalent‐circuit analysis. In this method, the inevitable errors in the method using the time‐domain reflection coefficient can be avoided by using the frequency‐domain reflection coefficient. © 2002 John Wiley & Sons, Inc. Microwave Opt Technol Lett 32: 393–396, 2002.

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