✦ LIBER ✦
Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chip : Tom Chen and Glen Sunada. IEEE Transactions on Very Large Scale Integration (VLSI), 1(2), 88 (June 1993)
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 110 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0026-2714
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