๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Design of a Reflective Aspherical Surface of a Compact Beam-Shaping Device

โœ Scribed by Toshimitsu Takaoka; Naoki Kawano; Yasuhiro Awatsuji; Toshihiro Kubota

Publisher
Optical Society of Japan
Year
2006
Tongue
English
Weight
709 KB
Volume
13
Category
Article
ISSN
1340-6000

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Design for e-beam testability โ€” A demand
Design for e-beam testability โ€” A demand for e-beam testing of future device generations ?
โœ K.D. Herrmann; E. Kubalek ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 883 KB

Based on the trends in development of integrated circuits {IC) until the year 2000 it is shown that, presuming the present capability of electron beam test systems, in future an electron beam test {EBT) will not be practicable anymore. This is mainly due to long measurement times, large measurement