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Design of a compact serial-kinematic scanner for high-speed atomic force microscopy: An analytical approach

✍ Scribed by Wadikhaye, S.P.; Yong, Y.K.; Moheimani, S.O.R.


Book ID
114461713
Publisher
The Institution of Engineering and Technology
Year
2012
Tongue
English
Weight
469 KB
Volume
7
Category
Article
ISSN
1750-0443

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