✦ LIBER ✦
Design Methodology and Protection Strategy for ESD-CDM Robust Digital System Design in 90-nm and 130-nm Technologies
✍ Scribed by Tze Wee Chen; Ito, C.; Loh, W.; Wei Wang; Doddapaneni, K.; Mitra, S.; Dutton, R.W.
- Book ID
- 114619299
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 583 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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