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Design Margin Exploration of Spin-Transfer Torque RAM (STT-RAM) in Scaled Technologies

โœ Scribed by Chen, Yiran; Wang, Xiaobin; Li, Hai; Xi, Haiwen; Yan, Yuan; Zhu, Wenzhong


Book ID
121856925
Publisher
IEEE
Year
2010
Tongue
English
Weight
956 KB
Volume
18
Category
Article
ISSN
1063-8210

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