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Design for hierarchical testability of RTL circuits obtained by behavioral synthesis

✍ Scribed by Ghosh, I.; Raghunathan, A.; Jha, N.K.

Book ID: 119778229
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 319 KB
Volume: 16
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.658568

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