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Design and test generation of C-testable high-speed carry-free dividers

✍ Scribed by Wey, C.-L.

Book ID: 114448176
Publisher: The Institution of Electrical Engineers
Year: 1995
Tongue: English
Weight: 454 KB
Volume: 142
Category: Article
ISSN: 1350-2387
DOI: 10.1049/ip-cdt:19951668

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