✦ LIBER ✦
Design and quality assurance of microwave bipolar transistors for high-reliability applications : Toshiaki Irie, Hajime Suzuki and Isamu Nagasako. NEC Res. A Develop., Japan No. 40, p. 1 (Jan. 1976)
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 127 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.