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Design and Analysis of Single-Event Tolerant Slave Latches for Enhanced Scan Delay Testing

✍ Scribed by Yang Lu, ; Lombardi, Fabrizio; Pontarelli, Salvatore; Ottavi, Marco

Book ID: 120974299
Publisher: IEEE
Year: 2014
Tongue: English
Weight: 606 KB
Volume: 14
Category: Article
ISSN: 1530-4388
DOI: 10.1109/TDMR.2013.2266543

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