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Depth selective microstructural analysis of ion implanted metals by cross-section transmission electron microscopy and computer simulation

✍ Scribed by E. Gerritsen; H.A.A. Keetels; H.J. Ligthart


Book ID
113280249
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
622 KB
Volume
39
Category
Article
ISSN
0168-583X

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