✦ LIBER ✦
Depth-selective defect analysis of Si implanted with As+ under channeling conditions using a variable-energy positron beam
✍ Scribed by K. Hirata; Y. Kobayashi
- Book ID
- 114169695
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 388 KB
- Volume
- 136-138
- Category
- Article
- ISSN
- 0168-583X
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