Depth Profiling Study of the CdTe/CdS/ITO/Glass Heterostructure with AES and GIXRD

✍ Scribed by A. Martel; F. Caballero-Briones; A.I. Oliva; R. Castro-Rodríguez; A. Iribarren; P. Bartolo-Pérez; J.L. Peña

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 118 KB
• Volume: 220
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200007)220:1<261::aid-pssb261>3.0.co;2-4