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Depth profiling of weakly absorbing samples by the crossed-beam photothermal deflection technique

✍ Scribed by Li, Bin-Cheng; Zhang, Shu-Yi

Book ID: 127242169
Publisher: Taylor and Francis Group
Year: 1998
Tongue: English
Weight: 684 KB
Volume: 45
Category: Article
ISSN: 0950-0340
DOI: 10.1080/09500349808230886

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