✦ LIBER ✦
Depth profiling of vacancy-type defects in homogenous and multilayered a-Si films by positron beam Doppler broadening
✍ Scribed by X Zou; D.P Webb; Y.C Chan; Y.W Lam; Y.F Hu; M Gong; C.D Beling; S Fung
- Book ID
- 117148883
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 140 KB
- Volume
- 227-230
- Category
- Article
- ISSN
- 0022-3093
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