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Depth Profiling of Poly( l -lactic acid)/Triblock Copolymer Blends with Time-of-Flight Secondary Ion Mass Spectrometry

โœ Scribed by Mahoney, Christine M.; Yu, Jinxiang; Gardella, Joseph A.


Book ID
121705002
Publisher
American Chemical Society
Year
2005
Tongue
English
Weight
197 KB
Volume
77
Category
Article
ISSN
0003-2700

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Time-of-flight secondary ion mass spectr
โœ Paul A. Zimmerman; David M. Hercules ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 862 KB

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to examine a series of poly(alky1 acrylate) (PAA) homopolymers containing a variety of ester groups. Reproducible spectra for the PAAs are obtained up to 3500 Da. The spectra are composed of clusters arranged in a series of repe