Depth profiling of hydrogen isotopes in thin, low-Z films by scattering recoil coincidence spectrometry

✍ Scribed by J.S. Forster; J.R. Leslie; T. Laursen

• Book ID: 113283463
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 360 KB
• Volume: 66
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/0168-583x(92)96153-p