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Depth profiling in surface regions of oxidized metal alloys by low energy PIXE

✍ Scribed by Dr�ke, V. ;Hecker, R. ;St�ver, D.


Book ID
105114784
Publisher
Springer-Verlag
Year
1987
Weight
345 KB
Volume
91
Category
Article
ISSN
0344-838X

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Depth profiling studies of oxidized allo
✍ K. Tsuji; K. Hirokawa 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 507 KB

## Abstract Depth profile analyses of elemental composition of Cu–Ni and Fe–Cr binary alloys oxidized in air and O~2~ gas mixtures were performed by glow discharge emission spectroscopy (GDS), adopting the cathode sputtering technique with a Grimm‐type glow lamp. The emission intensity ratio of Cu