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“Depth-Profiling” and Quantitative Characterization of the Size, Composition, Shape, Density, and Morphology of Fine Particles with SPLAT, a Single-Particle Mass Spectrometer

✍ Scribed by Zelenyuk, Alla; Yang, Juan; Song, Chen; Zaveri, Rahul A.; Imre, Dan


Book ID
127141401
Publisher
American Chemical Society
Year
2008
Tongue
English
Weight
290 KB
Volume
112
Category
Article
ISSN
1089-5639

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