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Depth profiling analysis of thick Ni- and Co-doped oxide layers on Cr-based alloys of the interconnector of a solid oxide fuel cell using rf GDMS

✍ Scribed by A. I. Saprykin; J. S. Becker; U. v. d. Crone; H.-J. Dietze


Book ID
105896713
Publisher
Springer
Year
1997
Tongue
English
Weight
76 KB
Volume
358
Category
Article
ISSN
1618-2650

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