Depth profiles, projected ranges, and secondary ion mass spectrometry relative sensitivity factors for more than 50 elements from hydrogen to uranium implanted into metals

✍ Scribed by R.G. Wilson; F.A. Stevie; G.E. Lux; C.L. Kirschbaum; S. Frank; J. Pallix

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 436 KB
• Volume: 51
• Category: Article
• ISSN: 0257-8972
• DOI: 10.1016/0257-8972(92)90264-b