✦ LIBER ✦
Depth profiles of nickel ion damage in helium-implanted nickel: K Farrell et al, Rad Effects, 62 (1982), 39–52
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 175 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0042-207X
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