✦ LIBER ✦
Depth profiles of H, C, O, Al and Si implants in a GaN substrate using trace element accelerator mass spectrometry
✍ Scribed by Lee J. Mitchell; G.V. Ravi Prasad; Primoz Pelicon; Eric B. Smith; Floyd D. McDaniel
- Book ID
- 113822928
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 252 KB
- Volume
- 219-220
- Category
- Article
- ISSN
- 0168-583X
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