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Depth distribution of the mean losses of electron-beam energy in a sample: Application in problems of quantitative X-ray spectral microanalysis

✍ Scribed by Mikheev, N. N.; Stepovich, M. A.; Shirokova, E. V.


Book ID
121539736
Publisher
Pleiades Publishing
Year
2013
Tongue
English
Weight
185 KB
Volume
7
Category
Article
ISSN
1027-4510

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