Depth distribution of carrier lifetime in 65 MeV oxygen ion irradiated silicon wafers

✍ Scribed by N.S. Shinde; S.S. Dahiwale; D. Kanjilal; V.N. Bhoraskar; S.D. Dhole

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 268 KB
• Volume: 244
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2005.11.030