✦ LIBER ✦
Deposition rate dependence of the critical optimization temperature for thin film properties: Evidence for the disturbed area reevaporation mechanism: PS Vincett, J Vac Sci Technol, 21 (4), 1982, 972–979
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 140 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0042-207X
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