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Deposition of ultra-thin oxide dielectrics for MOSFETs by a combination of low-temperature plasma-assisted oxidation, and intermediate and high-temperature rapid thermal processing

✍ Scribed by G. Lucovsky; V. Misra; S.V. Hattangady; T. Yasuda; J.J. Wortman


Book ID
115990335
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
406 KB
Volume
187
Category
Article
ISSN
0022-3093

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