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Deposition and characterization of YBaCuO thin films on silicon substrates: Interface analysis

✍ Scribed by D.B. Fenner; D.K. Fork; J.B. Boyce; G.A.N. Connell; A.M. Viano


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
152 KB
Volume
162-164
Category
Article
ISSN
0921-4534

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