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Dependence on crystallographic orientation of trapping properties in a polished MgO single crystal

✍ Scribed by Dammak, N; Kallel, A; Fakhfakh, Z; Tréheux, D

Book ID
121205014
Publisher
NRC Research Press
Year
2002
Tongue
English
Weight
292 KB
Volume
80
Category
Article
ISSN
0008-4204

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Crystallographic orientation dependence
Crystallographic orientation dependence of radiation damage in Ar+ implanted YSZ and MgO single crystals
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Single crystals of magnesia (MgO) and yttria-stabilized zirconia (YSZ) with (1 0 0), (1 1 0) and (1 1 1) orientations were implanted with 100 and 150 keV Ar + ions at room temperature. Rutherford backscattering spectrometry combined with ion channeling (RBS/C) was used to analyze radiation damage. R