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Dependence of X-ray yields on different parameters for light element matrices in thick target PIXE and use of standards for calibration in such analysis

✍ Scribed by M. Khaliquzzaman; S.T. Lam; D.M. Sheppard; L.G. Stephens-Newsham


Publisher
Elsevier Science
Year
1983
Weight
556 KB
Volume
216
Category
Article
ISSN
0167-5087

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