𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy

✍ Scribed by Chon, Hyung-Su; Park, Gisung; Lee, Sang-Bum; Yoon, Seokchan; Kim, Jaisoon; Lee, Jai-Hyung; An, Kyungwon


Book ID
115390758
Publisher
Optical Society of America
Year
2007
Tongue
English
Weight
220 KB
Volume
24
Category
Article
ISSN
1084-7529

No coin nor oath required. For personal study only.