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Dependence of the a-Si:H defect density of states on the magnetic field profile of an electron cyclotron resonance microwave plasma

✍ Scribed by F.S Pool; J.M Essick; Y.H Shing; R.T Mather


Book ID
107864615
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
401 KB
Volume
240
Category
Article
ISSN
0040-6090

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