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Dependence of self-heating effects on operation conditions and device structures for polycrystalline silicon TFTs

✍ Scribed by Takechi, K.; Nakata, M.; Kanoh, H.; Otsuki, S.; Kaneko, S.


Book ID
114618091
Publisher
IEEE
Year
2006
Tongue
English
Weight
609 KB
Volume
53
Category
Article
ISSN
0018-9383

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