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Dependence of Ferroelectric Properties on Thickness of BiFeO 3 Thin Films Fabricated by Chemical Solution Deposition

✍ Scribed by Singh, Sushil K.; Ueno, Risako; Funakubo, Hiroshi; Uchida, Hiroshi; Koda, Seiichiro; Ishiwara, Hiroshi

No coin nor oath required. For personal study only.

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