Dependence of electron and hole lifetimes on the majority recombination impurity concentration in the presence of auxiliary carrier trapping centers

✍ Scribed by V. A. Kholodnov; P. S. Serebrennikov

• Book ID: 110123437
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 1997
• Tongue: English
• Weight: 78 KB
• Volume: 23
• Category: Article
• ISSN: 1063-7850
• DOI: 10.1134/1.1261949