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Dependence of current match on back-gate bias in weakly inverted MOS transistors and its modeling

✍ Scribed by Ming-Jer Chen; Jih-Shin Ho; Tzuen-Hsi Huang


Book ID
119774468
Publisher
IEEE
Year
1996
Tongue
English
Weight
396 KB
Volume
31
Category
Article
ISSN
0018-9200

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