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Dependence of critical current density on microstructure in Ag sheathed Ba2YCu3O6+x tapes

✍ Scribed by K. Osamura; T. Takayama; S. Ochial

Book ID: 107746200
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 438 KB
Volume: 30
Category: Article
ISSN: 0011-2275
DOI: 10.1016/0011-2275(90)90171-8

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