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Dependence of annealing time on structural and morphological properties of Ca(Zr0.05Ti0.95)O3 thin films

✍ Scribed by L.S. Cavalcante; A.Z. Simões; M.O. Orlandi; M.R.M.C. Santos; J.A. Varela; E. Longo


Book ID
116601679
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
752 KB
Volume
453
Category
Article
ISSN
0925-8388

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Dielectric properties of Ca(Zr0.05Ti0.95
✍ L.S. Cavalcante; A.Z. Simões; L.P.S. Santos; M.R.M.C. Santos; E. Longo; J.A. Var 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 273 KB

Ca(Zr 0.05 Ti 0.95 )O 3 (CZT) thin films were grown on Pt(1 1 1)/Ti/SiO 2 /Si(1 0 0) substrates by the soft chemical method. The films were deposited from spin-coating technique and annealed at 928 K for 4 h under oxygen atmosphere. CZT films present orthorhombic structure with a crack free and gran