Density of states determination of mixed semiconductors by neutron diffraction: R. Beserman, M. Zigone, W. Drexel and C. Marti Solid State Communications, 18(3), p.419 (1976)

• Book ID: 108360973
• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 147 KB
• Volume: 10
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(79)80141-x