Demonstrated reliability of plastic-encapsulated microcircuits for missile applications : SUN MAN TAM. IEEE Transactions on Reliability, 44(1), 8 (March 1995)

• Book ID: 103287340
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 114 KB
• Volume: 36
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(96)84383-6