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Delay time studies and electron mobility measurement in a-Si:H TFT

✍ Scribed by Bashir, R.; Subramanian, C.K.; Neudeck, G.W.; Chung, K.Y.


Book ID
114536222
Publisher
IEEE
Year
1989
Tongue
English
Weight
483 KB
Volume
36
Category
Article
ISSN
0018-9383

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