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Delay time sensitivity analysis of multi-generation BiCMOS digital circuits

✍ Scribed by Rofail, S.S.; Seng, Y.K.; Seng, S.Y.

Book ID: 114447561
Publisher: The Institution of Electrical Engineers
Year: 1997
Tongue: English
Weight: 685 KB
Volume: 144
Category: Article
ISSN: 1350-2409
DOI: 10.1049/ip-cds:19970730

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