Delay defect diagnosis based upon a statistical timing model-the first step

✍ Scribed by Krstic, A.; Wang, L.-C.; Cheng, K.-T.; Liou, J.-J.; Abadir, M.S.

• Book ID: 114448557
• Publisher: The Institution of Electrical Engineers
• Year: 2003
• Tongue: English
• Weight: 204 KB
• Volume: 150
• Category: Article
• ISSN: 1350-2387
• DOI: 10.1049/ip-cdt:20030834