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Degradation processes in thin-film MIM cathodes: Calculation of the distribution of the temperature field in and near a formed channel

โœ Scribed by V. M. Gaponenko; E. V. Nefedtsev; A. V. Chernyavskii


Book ID
112370160
Publisher
Springer
Year
1993
Tongue
English
Weight
410 KB
Volume
36
Category
Article
ISSN
1573-9228

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