Degradation process and fluctuation mechanism of contact resistance for twisted conductor splice

✍ Scribed by Masashi Kuribayashi; Masamitsu Tokuda; Tokihiro Kawaguchi; Mitsugu Fujiwara

• Book ID: 112075484
• Publisher: John Wiley and Sons
• Year: 1986
• Tongue: English
• Weight: 483 KB
• Volume: 69
• Category: Article
• ISSN: 8756-6621
• DOI: 10.1002/ecja.4410691113