๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Degradation of the Reset Switching During Endurance Testing of a Phase-Change Line Cell

โœ Scribed by Goux, L.; Tio Castro, D.; Hurkx, G.; Lisoni, J.G.; Delhougne, R.; Gravesteijn, D.J.; Attenborough, K.; Wouters, D.J.


Book ID
114619289
Publisher
IEEE
Year
2009
Tongue
English
Weight
308 KB
Volume
56
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES