✦ LIBER ✦
Degradation of Radiation Hardness in CMOS Integrated Circuits Passivated with Plasma-Deposited Silicon Nitride
✍ Scribed by Anderson, Richard E.
- Book ID
- 114661797
- Publisher
- IEEE
- Year
- 1979
- Tongue
- English
- Weight
- 849 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0018-9499
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