Degradation of green light emitting diodes LPE-GaP:N I. electron beam characterization and deep-level spectroscopy

✍ Scribed by Oelgart, G. ;Rheinländer, B. ;Haefner, H. ;Pickenhain, R.

• Publisher: John Wiley and Sons
• Year: 1984
• Tongue: English
• Weight: 560 KB
• Volume: 86
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210860245